Analisis Aitem Subtes DF 1 (Electric Circuits) pada USU General Reasoning Test (U-GRT)

Abstract

This study used a descriptive quantitative method and used a sampling technique, namely convenience sampling. The purpose of this study was to analyze the DF 1 (Electric Circuits) subtest items on the USU General Reasoning Test (U-GRT). Analysis of the 25 items using Rasch index modeling which includes analysis of the reliability coefficient, the coefficient of validity analysis based on internal structure, item difficulty analysis, and item reliability. This study uses secondary data, where data collection by previous researchers was carried out by giving classical tests to 207 samples with an age range of 15 to 25 years divided into 4 sets (A, B, C, D). The reliability coefficient uses person reliability which produces a value of 0.323 in set A, 0.461 in set B, -0.0150 in set C, and 0.538 in set D which is classified as weak for all sets. The validity coefficient using the MNSQ infit value and the MNSQ outfit has a value in the range of 0.5-1.5 in 20 items so that it is stated well in the measurement. However, there were 6 invalid items, namely items in order 1, 14, 15, 17, 18, and 19. The item measure values obtained ranged from -4.78 to 1,477. While the person measure values obtained range from -4,881 to 1,133. The results of this study indicate that the validity of the dominant test is good, but it still needs to be re-evaluated, especially for the six invalid subtests. In addition, it is necessary to re-test with a larger number of samples in order to obtain better reliability and item difficulty index results