| dc.description.abstract | This study used a descriptive quantitative method and used a sampling
technique, namely convenience sampling. The purpose of this study
was to analyze the DF 1 (Electric Circuits) subtest items on the USU
General Reasoning Test (U-GRT). Analysis of the 25 items using
Rasch index modeling which includes analysis of the reliability
coefficient, the coefficient of validity analysis based on internal
structure, item difficulty analysis, and item reliability. This study uses
secondary data, where data collection by previous researchers was
carried out by giving classical tests to 207 samples with an age range
of 15 to 25 years divided into 4 sets (A, B, C, D). The reliability
coefficient uses person reliability which produces a value of 0.323 in
set A, 0.461 in set B, -0.0150 in set C, and 0.538 in set D which is
classified as weak for all sets. The validity coefficient using the MNSQ
infit value and the MNSQ outfit has a value in the range of 0.5-1.5 in
20 items so that it is stated well in the measurement. However, there
were 6 invalid items, namely items in order 1, 14, 15, 17, 18, and 19.
The item measure values obtained ranged from -4.78 to 1,477. While
the person measure values obtained range from -4,881 to 1,133. The
results of this study indicate that the validity of the dominant test is
good, but it still needs to be re-evaluated, especially for the six invalid
subtests. In addition, it is necessary to re-test with a larger number of
samples in order to obtain better reliability and item difficulty index
results | en_US |
