Analisis Perbandingan Kinerja Keandalan Sen Seri dengan Sen Paralel Menggunakan Topologi Omega Ukuran 8x8

Abstract

The reliability of a switching network has been a concern for experts in the past decade. The performance of a switch is largely determined by its reliability. The reliability value of switching elements ranges from 0.90 – 0.99. While the overall switching reliability value is determined by the reliability value of the switching element that builds it. Each switching topology has a different pattern of interconnection between levels. The pattern of interconnection greatly determines the value of reliability it has. The increasing number of central customers in telecommunication systems and jobs that are computed by processors with processors or memory in computer systems causes the need for high system reliability. Therefore, lately researchers have been trying to make modifications to a system switching to increase its reliability. Topology Shuffle Exchange Network (SEN) is of concern to some researchers because of the ease of interconnection patterns between levels it has called perfect shuffle. In this thesis, research was carried out on the topology of SEN measuring 8×8 which the number of levels was added in series and at the same time paralleled it. With parallel structures the size of the SEN becomes 16×16. The methods used to analyze the reliability of SEN in this study are the block diagram method and the matrix method. While the reliability measured is the reliability of the terminal. From the analysis carried out by taking the reliability of the switching element r with values from 0.90-0.99, then with the addition of the number of SEN levels in series produced the reliability of SEN + 1, SEN + 2 and SEN + 3, which are respectively 0.78076, 0.77821, and 0.53140 for r = 0.90. Meanwhile, for r = 0.99, the results were obtained respectively: 0.979774, 0.97971, and 0.94150. It appears that the best SEN series is SEN+1. With the same r as the SEN series above, the calculation of the reliability of the SEN measuring 8×8 parallelized (PSEN) is higher than the SEN series of the same size. The constraints of PSEN , PSEN+1, PSEN+2 and PSEN+3 are 0.88173, 0.91160, 0.91023, and 0.98940 for r=0.90, respectively. As for r = 0.99, the results are 0.99909, 0.99909, and 0.99999. From these results, it can be concluded that PSEN+3 has the best reliability value.